Physical Sciences Inc. (PSI) has been awarded a research program from the Department of Energy to develop a high-resolution optical microscopy system that can be installed on many common electron microscopes.
Electron microscopes and optical microscopes – two of the most important tools for most fields of science – offer complementary methods of profiling surface morphologies and chemical processes of microscopic specimens. However, currently there is no quick, easy way to directly compare or overlay the images and other data provided by these separate instruments. PSI’s high-resolution optical microscopy system that can be installed on many common electron microscopes will address this problem. This optical system will allow instantaneous overlay of optical and electron microscope images. It will also enable simple, direct comparison of surface morphological and chemical maps obtained using complementary electron and optical instruments.
Electron and optical microscopes are essential tools for most fields of science. PSI’s methods of seamlessly integrating them allows scientists to examine microscopic specimens using the best aspects of both types of microscopic imaging. The optical devices, microscopy methods and related software developed in this program will result in a third-party product for electron microscopes allowing researchers in chemistry, physics, biology and many other fields to increase productivity and generate new, otherwise unobtainable scientific insights.
For more information, contact:
Dr. Julia Dupuis
Vice President, Tactical Systems
Physical Sciences Inc.
Telephone: (978) 689-0003