Copyright © 2022 Society of Photo-Optical Instrumentation Engineers. This paper was presented at the SPIE Defense + Commercial Sensing, 4-7 April, 2022, Orlando, FL (Paper No. 12094-12), and is made available as an electronic reprint (preprint) with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.